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Michael Kidger Memorial Scholarship / Awardees / Winner 2008
Michael Kidger Memorial Scholarship:
AWARDEE - TOBIAS SCHMID
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Tobias Schmid is a PhD candidate at CREOL, the College of Optics and Photonics at the University of Central Florida conducting research in the Optical Diagnostics and Applications Laboratory directed by Jannick Rolland, Professor of Optics and Computer Science. His research focus is on applying and extending Nodal Aberration Theory, which describes aberration fields of misaligned optical systems, originally developed in the 1970s by Kevin Thompson. A recent contribution has been the development of a coordinate system independent formulation of the method for locating aberration field centers. This new ‘real ray’ based approach enables a working optical designer using a commercial optical design package to directly predict aberration field nodal behavior as a function of misalignment. The previous methods, based on an extended paraxial treatment by Buchroeder, were limited to a specific type of tilt and decenter model whereas a designer typically has access to, and uses, up to 5 different methods for managing tilt and decenter modeling.
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The equivalence of both approaches to calculate the aberration field center locations has been demonstrated and is shown in a paper recently submitted to JOSA A. The calculation of the aberration field centers has been implemented in CODE V where it is combined with Full
Field Displays and with macros developed to compute the characteristic quantities in Nodal Aberration Theory. The results were successfully validated based on real raytracing and subsequent fit to Zernike polynomials; a completely independent methodology for verification purposes.
Most recently Tobias has been applying Nodal Aberration Theory to fully describe alignment induced aberrations on a surface-by-surface basis for a wide class of astronomical telescopes. Not only total aberration at the image plane, but also effects originating from each surface can be analyzed separately. Because nodal location is linear with perturbation, the resulting insights from applying these tools enables a fundamental understanding of misalignment effects, which can provide valuable insight in the process of developing an alignment plan. Tobias has also recently undertaken research into aberations of rotationally non-symmetric optical systems which has application in many domains including EUV lithography.
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Professor Jannick Rolland receiving award for Tobias from Tina Kidger and David Williamson at SPIE Europe Symposium Glasgow, Scotland 2 Sept 2008
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